19September 2022parallel architectures. "One of our key differentiators is the ability to deploy SLT to conduct tests in high volume, and in massively parallel architectures," states Chandran Nair, CEO at AEM.A key concern faced by semicon-ductor manufacturers is the increasing transistor density, which makes semicon-ductor chips susceptible to temperature-related defects while testing. To prevent this issue, AEM has engineered the Active Thermal Control (ATC) system where it concurrently tests millions of high-end chips coming out of the produc-tion line. Furthermore, AEM offers tre-mendous performance in active thermal control, which is required for almost all heterogeneous packages and advanced chips. Despite its best-in-class capabili-ties in SLT over the last five years, AEM has continued to build up its R&D capa-bilities and has acquired technology to reduce reliance on "Big Iron" functional testers, which have high capital costs, as well as power and floor space require-ments. Beyond that, the ATC system can also conduct burn-in testing in a largely parallel architecture, changing the current paradigm of burn-in testing in ovens through conductive technology to proactively detect failures. This solution enables a higher throughput on the test systems and processes, and also minimizes the overall increasing cost of tests for advanced package devices, high-performance computing devices, and application processors. Additionally, AEM provides its cus-tomers with a system-level view of the test by gathering raw data from the pro-cess. This enables customers to analyze the data and gain deep insights into the quality and reliability of the devices in order to make decisions that positively impact the testing process. Further exemplifying the company's core competencies, Nair mentioned an instance wherein AEM collaborated with UTAC Holdings (UTAC), a global semi-conductor test and assembly services provider, to develop a cost-effective and next-generation test system solution for CMOS image sensors. He highlighted that the rapidly growing demand for advanced image sensors in applications such as security, automotive safety, au-tonomous vehicles, and industrial ap-plication will drive CMOS image sensor products to grow significantly in future. In 2021, AEM successfully delivered a fully integrated CMOS Image Sen-sor Test Cell to UTAC, complete with an illuminator, tester, and handler. Fur-thermore, AEM also has an Operations Excellence Program which works with various departments within the organiza-tion to ensure the safety and reliability of the products before they are shipped to customers.With customer intimacy at its core, AEM builds strong partnerships with its customers through a global network, tai-loring solutions and delivering services that meet their needs. As pioneers of SLT, AEM will continue to provide asynchro-nous, modular, highly-parallel test cell solutions to run SLT, final test, or burn-in all-in-one system in the future. One of our key differentiators is the ability to deploy SLT to conduct tests in high volume, and massively parallel architectures
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